Our collaborative work with Fritz Haber Institute is published in Science Advances. We demonstrate (nearly) atomic-scale near-field imaging using a new technique of “ultralow tip oscillation amplitude” in scattering-type scanning near-field optical microscopy.
Publication information
Scattering near-field optical microscopy at 1-nm resolution using ultralow tip oscillation amplitudes
DOI: 10.1126/sciadv.adu1415
